Dr. Samar Guharay E-mail: sguharay-at-gmu.edu, office: Research I, room 367
Course number for registration: 73832 "Strategies for Nanocharacterization," Sec. 001
Science & Krug Hall 253, Thursdays 7:20-10:00 PM
Introduces the fundamental principles, interaction of electrons, ions and photons with materials, instrumentation development, measurement methods and application platforms to image and probe optical, electronic, chemical and mechanical properties at nanoscale. Discusses relative merits of different techniques and identifies the most suitable technique for specific measurements. Evaluates the spatial resolution and detection limits for different techniques: Scanning Electron Microscopy, Transmission Electron Microscopy, Atomic Force Microscopy, ion beam techniques, surface analysis techniques, and light microscopy and spectroscopy. Emphasizes on the instruments likely to be encountered in the cutting-edge research and industry and discusses a few examples.
Assignments: 30%; Midterm: 30%; Final: 40%
Last modified: August 20, 2006